BibTeX record journals/mr/ModlinskiWRJSTTPW04

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@article{DBLP:journals/mr/ModlinskiWRJSTTPW04,
  author    = {Robert Modlinski and
               Ann Witvrouw and
               Petar Ratchev and
               A. Jourdain and
               Veerle Simons and
               H. A. C. Tilmans and
               Jaap M. J. den Toonder and
               Robert Puers and
               Ingrid De Wolf},
  title     = {Creep as a reliability problem in {MEMS}},
  journal   = {Microelectron. Reliab.},
  volume    = {44},
  number    = {9-11},
  pages     = {1733--1738},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2004.07.066},
  doi       = {10.1016/j.microrel.2004.07.066},
  timestamp = {Sat, 22 Feb 2020 19:29:13 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/ModlinskiWRJSTTPW04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}