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"Simulation and modelling of long term reliability of digital circuits ..."

Jorgue Daniel Aguirre Morales et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.151

access: closed

type: Journal Article

metadata version: 2021-12-23

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Jorgue Daniel Aguirre Morales, François Marc, A. Bensoussan, A. Durier:
Simulation and modelling of long term reliability of digital circuits implemented in FPGA. Microelectron. Reliab. 88-90: 1130-1134 (2018)

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