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"Characterization of HTRB stress effects on SiC MOSFETs using photon ..."
N. Moultif et al. (2017)
- N. Moultif, Eric Joubert, M. Masmoudi, Olivier Latry:
Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures. Microelectron. Reliab. 76-77: 243-248 (2017)
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