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"A new lifetime prediction method for hot-carrier degradation in n-MOSFETs ..."
Fuchen Mu et al. (2001)
- Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan:
A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. Microelectron. Reliab. 41(11): 1909-1913 (2001)
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