"Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit."

C. Mukherjee et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.05.001

access: closed

type: Journal Article

metadata version: 2022-08-31

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C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux:
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. Microelectron. Reliab. 73: 146-152 (2017)

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