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"Failure analysis methodology on donut pattern failure due to photovoltaic ..."

Soh Ping Neo et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.036

access: closed

type: Journal Article

metadata version: 2021-12-21

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  - https://dblp.org/rec/journals/mr/NeoQANMTSCML17
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam:
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. Microelectron. Reliab. 76-77: 255-260 (2017)

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