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"Normalized differential conductance to study current conduction mechanisms ..."

T. H. Nouibat et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.10.001

access: closed

type: Journal Article

metadata version: 2023-11-13

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T. H. Nouibat, Zitouni Messai, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey:
Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectron. Reliab. 91: 183-187 (2018)

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