"A compact model for early electromigration failures of copper ..."

R. L. de Orio, Hajdin Ceric, Siegfried Selberherr (2011)

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DOI: 10.1016/J.MICROREL.2011.07.049

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type: Journal Article

metadata version: 2021-10-14

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R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
A compact model for early electromigration failures of copper dual-damascene interconnects. Microelectron. Reliab. 51(9-11): 1573-1577 (2011)

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