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"A review of DC extraction methods for MOSFET series resistance and ..."
Adelmo Ortiz-Conde et al. (2017)
- Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017)
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