"Ageing defect detection on IGBT power modules by artificial training ..."

Amrane Oukaour et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.08.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart:
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectron. Reliab. 51(2): 386-391 (2011)

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