"Impact of negative bias temperature instability on digital circuit ..."

Vijay Reddy et al. (2005)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2004.05.023

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ReddyKMRNRK05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ReddyKMRNRK05
Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan:
Impact of negative bias temperature instability on digital circuit reliability. Microelectron. Reliab. 45(1): 31-38 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.