"Light Emission to Time Resolved Emission For IC Debug and Failure Analysis."

Mustapha Remmach et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.034

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit:
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45(9-11): 1476-1481 (2005)

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