"Separating HBT wearout from defects during early life operation."

William J. Roesch, Philip Rains (2014)

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DOI: 10.1016/J.MICROREL.2013.09.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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William J. Roesch, Philip Rains:
Separating HBT wearout from defects during early life operation. Microelectron. Reliab. 54(2): 360-365 (2014)

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