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"Impact of aging on the soft error rate of 6T SRAM for planar and bulk ..."

Thomas Rousselin et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.078

access: closed

type: Journal Article

metadata version: 2020-02-22

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Thomas Rousselin, G. Hubert, Didier Regis, Marc Gatti, A. Bensoussan:
Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. Microelectron. Reliab. 76-77: 159-163 (2017)

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