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"In-depth investigation of metallization aging in power MOSFETs."

R. Ruffilli et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.036

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/RuffilliBDLWL15
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros:
In-depth investigation of metallization aging in power MOSFETs. Microelectron. Reliab. 55(9-10): 1966-1970 (2015)

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