"Voltage-based fault path tracing by transistor operating point analysis."

Masaru Sanada (2008)

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DOI: 10.1016/J.MICROREL.2008.07.055

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type: Journal Article

metadata version: 2020-02-22

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Masaru Sanada:
Voltage-based fault path tracing by transistor operating point analysis. Microelectron. Reliab. 48(8-9): 1533-1538 (2008)

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