"Variations in junction capacitance and doping activation associated with ..."

Carlo De Santi et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.053

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type: Journal Article

metadata version: 2024-05-07

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Carlo De Santi, Matteo Meneghini, S. Carraro, Simone Vaccari, Nicola Trivellin, Stefania Marconi, Michael Marioli, Gaudenzio Meneghesso, Enrico Zanoni:
Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes. Microelectron. Reliab. 53(9-11): 1534-1537 (2013)

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