"Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power ..."

A. Sasikumar et al. (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.10.026

access: closed

type: Journal Article

metadata version: 2024-11-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/SasikumarACJSZR16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/SasikumarACJSZR16
A. Sasikumar, Aaron R. Arehart, D. W. Cardwell, C. M. Jackson, W. Sun, Z. Zhang, S. A. Ringel:
Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs. Microelectron. Reliab. 56: 37-44 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.