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"End of life and acceleration modelling for power diodes under high ..."

Oliver Schilling et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.137

access: closed

type: Journal Article

metadata version: 2022-03-23

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Oliver Schilling, Klaus Leitner, Karl-Dietger Schulze, Frank Umbach:
End of life and acceleration modelling for power diodes under high temperature reverse bias stress. Microelectron. Reliab. 64: 458-463 (2016)

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