"Effects of inhomogeneous negative bias temperature stress on p-channel ..."

Christian Schlünder et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.03.017

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type: Journal Article

metadata version: 2024-02-05

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Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes:
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectron. Reliab. 45(1): 39-46 (2005)

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