"Reliability of large periphery GaN-on-Si HFETs."

Sameer Singhal et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.02.009

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type: Journal Article

metadata version: 2024-10-06

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Sameer Singhal, T. Li, Apurva Chaudhari, Allen W. Hanson, Robert J. Therrien, Wayne Johnson, Walter Nagy, J. Marquart, Pradeep Rajagopal, John C. Roberts:
Reliability of large periphery GaN-on-Si HFETs. Microelectron. Reliab. 46(8): 1247-1253 (2006)

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