"AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise ..."

A. Sozza et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.062

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type: Journal Article

metadata version: 2020-04-16

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A. Sozza, Arnaud Curutchet, Christian Dua, Nathalie Malbert, Nathalie Labat, André Touboul:
AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectron. Reliab. 46(9-11): 1725-1730 (2006)

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