"Experimental and comparative study of gamma radiation effects on Si-IGBT ..."

Boubekeur Tala-Ighil et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.136

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type: Journal Article

metadata version: 2024-08-14

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Boubekeur Tala-Ighil, Jean-Lionel Trolet, Hamid Gualous, Philippe Mary, Stéphane Lefebvre:
Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. Microelectron. Reliab. 55(9-10): 1512-1516 (2015)

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