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"A junction characterization for microelectronic devices quality and ..."
W. Tazibt et al. (2008)
- W. Tazibt, P. Mialhe, J. P. Charles, M. A. Belkhir:
A junction characterization for microelectronic devices quality and reliability. Microelectron. Reliab. 48(3): 348-353 (2008)
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