"Degradation in polysilicon thin film transistors related to the quality of ..."

Hamid Toutah et al. (2003)

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DOI: 10.1016/S0026-2714(03)00271-3

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type: Journal Article

metadata version: 2020-02-22

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Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectron. Reliab. 43(9-11): 1531-1535 (2003)

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