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"Experimental extraction of degradation parameters after constant voltage ..."
C. Trapes, Didier Goguenheim, Alain Bravaix (2005)
- C. Trapes, Didier Goguenheim
, Alain Bravaix
:
Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectron. Reliab. 45(5-6): 883-886 (2005)
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