"ESD tests on 850 nm GaAs-based VCSELs."

Massimo Vanzi et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.023

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type: Journal Article

metadata version: 2023-03-21

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Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao:
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64: 617-622 (2016)

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