"Test methodology for durability estimation of surface mount interconnects ..."

Joe Varghese, Abhijit Dasgupta (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2006.02.002

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/VargheseD07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/VargheseD07
Joe Varghese, Abhijit Dasgupta:
Test methodology for durability estimation of surface mount interconnects under drop testing conditions. Microelectron. Reliab. 47(1): 93-103 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.