"An experimental approach to characterize rate-dependent failure envelopes ..."

Joe Varghese, Abhijit Dasgupta (2007)

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DOI: 10.1016/J.MICROREL.2006.07.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Joe Varghese, Abhijit Dasgupta:
An experimental approach to characterize rate-dependent failure envelopes and failure site transitions in surface mount assemblies. Microelectron. Reliab. 47(7): 1095-1102 (2007)

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