"Experimental study of charge generation mechanisms in power MOSFETs due to ..."

Francesco Velardi et al. (2003)

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DOI: 10.1016/S0026-2714(03)00022-2

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type: Journal Article

metadata version: 2020-02-22

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Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, A. Candelori:
Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact^,. Microelectron. Reliab. 43(4): 549-555 (2003)

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