"Accelerated testing for failures of tantalum capacitors."

Johanna Virkki et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.11.006

access: closed

type: Journal Article

metadata version: 2023-09-20

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Johanna Virkki, Tomi Seppälä, Laura Frisk, Pekka Heino:
Accelerated testing for failures of tantalum capacitors. Microelectron. Reliab. 50(2): 217-219 (2010)

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