BibTeX record journals/mr/WangDWNCSSBLGCB18

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@article{DBLP:journals/mr/WangDWNCSSBLGCB18,
  author    = {Haibin Wang and
               Xixi Dai and
               Yangsheng Wang and
               Issam Nofal and
               Li Cai and
               Zicai Shen and
               Wanxiu Sun and
               Jinshun Bi and
               Bo Li and
               Gang Guo and
               Li Chen and
               Sang H. Baeg},
  title     = {A single event upset tolerant latch design},
  journal   = {Microelectron. Reliab.},
  volume    = {88-90},
  pages     = {909--913},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.07.019},
  doi       = {10.1016/j.microrel.2018.07.019},
  timestamp = {Sat, 22 Feb 2020 19:27:53 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/WangDWNCSSBLGCB18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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