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"Deteriorated radiation effects impact on the characteristics of MOS ..."

Jian Wang et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.04.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jian Wang, Wenhua Wang, Ru Huang, Yunpeng Pei, Shoubin Xue, Xin'an Wang, Chunhui Fan, Yangyuan Wang:
Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger configuration. Microelectron. Reliab. 50(8): 1094-1097 (2010)

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