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"Low-cycle fatigue testing and thermal fatigue life prediction of ..."
Kazuki Watanabe et al. (2018)
- Kazuki Watanabe
, Yoshiharu Kariya, Naoyuki Yajima, Kizuku Obinata, Yoshiyuki Hiroshima, Shunichi Kikuchi, Akiko Matsui, Hiroshi Shimizu:
Low-cycle fatigue testing and thermal fatigue life prediction of electroplated copper thin film for through hole via. Microelectron. Reliab. 82: 20-27 (2018)
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