"A reliability comparison of InGaP/GaAs HBTs with and without passivation ..."

B. P. Yan et al. (2001)

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DOI: 10.1016/S0026-2714(01)00222-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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B. P. Yan, Y. F. Yang, C. C. Hsu, H. B. Lo, E. S. Yang:
A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge. Microelectron. Reliab. 41(12): 1959-1963 (2001)

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