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"Influence of TCE concentration in thermal oxidation on reliability of SiC ..."
Bing-Liang Yang, Paul C. K. Kwok, P. T. Lai (2006)
- Bing-Liang Yang, Paul C. K. Kwok, P. T. Lai:
Influence of TCE concentration in thermal oxidation on reliability of SiC MOS capacitors under Fowler-Nordheim electron injection. Microelectron. Reliab. 46(12): 2044-2048 (2006)
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