"Quality-related fault detection for dynamic process based on ..."

Yishun Liu et al. (2025)

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DOI: 10.1016/J.NEUNET.2024.106819

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type: Journal Article

metadata version: 2025-03-03

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Yishun Liu, Keke Huang, Benedict Jun Ma, Ke Wei, Yuxuan Li, Chunhua Yang, Weihua Gui:
Quality-related fault detection for dynamic process based on quality-driven long short-term memory network and autoencoder. Neural Networks 181: 106819 (2025)

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