"A Parametrical Model for Instance-Dependent Label Noise."

Shuo Yang et al. (2023)

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DOI: 10.1109/TPAMI.2023.3301876

access: closed

type: Journal Article

metadata version: 2023-11-28

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Shuo Yang, Songhua Wu, Erkun Yang, Bo Han, Yang Liu, Min Xu, Gang Niu, Tongliang Liu:
A Parametrical Model for Instance-Dependent Label Noise. IEEE Trans. Pattern Anal. Mach. Intell. 45(12): 14055-14068 (2023)

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