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"Status of Reliability of GaN-Based Heterojunction Field Effect Transistors."

Jacob H. Leach, Hadis Morkoç (2010)

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DOI: 10.1109/JPROC.2010.2044858

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/pieee/LeachM10
Jacob H. Leach, Hadis Morkoç:
Status of Reliability of GaN-Based Heterojunction Field Effect Transistors. Proc. IEEE 98(7): 1127-1139 (2010)

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