"VLSI reliability challenges: from device physics to wafer scale systems."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Eiji Takeda et al. (1993)

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DOI: 10.1109/5.220898

access: closed

type: Journal Article

metadata version: 2022-06-13

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Eiji Takeda, Kunihiko Ikuzaki, Hisao Katto, Yuzuru Ohji, Kenji Hinode, Akemi Hamada, Toshiyuki Sakuta, Takahiro Funabiki, Toshio Sasaki:
VLSI reliability challenges: from device physics to wafer scale systems. Proc. IEEE 81(5): 653-674 (1993)

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