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"Reliability of HfO2-Based Ferroelectric FETs: A Critical Review ..."
Nicolò Zagni et al. (2023)
- Nicolò Zagni
, Francesco Maria Puglisi
, Paolo Pavan
, Muhammad Ashraful Alam
:
Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges. Proc. IEEE 111(2): 158-184 (2023)
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