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"A new distance measure for non-identical data with application to image ..."

Muthukaruppan Swaminathan et al. (2017)

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DOI: 10.1016/J.PATCOG.2016.10.018

access: closed

type: Journal Article

metadata version: 2023-08-28

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  - journals/pr/SwaminathanYPSC17
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  - https://dblp.org/rec/journals/pr/SwaminathanYPSC17
Muthukaruppan Swaminathan, Pankaj Kumar Yadav, Obdulio Piloto, Tobias Sjöblom, Ian Cheong:
A new distance measure for non-identical data with application to image classification. Pattern Recognit. 63: 384-396 (2017)

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