"Two novel characteristics in palmprint verification: datum point ..."

David Dapeng Zhang, Wei Shu (1999)

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DOI: 10.1016/S0031-3203(98)00117-4

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type: Journal Article

metadata version: 2020-02-24

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David Dapeng Zhang, Wei Shu:
Two novel characteristics in palmprint verification: datum point invariance and line feature matching. Pattern Recognit. 32(4): 691-702 (1999)

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