"Self-supervised assisted multi-task learning network for one-shot defect ..."

Ziqiang Hu et al. (2024)

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DOI: 10.1016/J.PATREC.2024.05.017

access: closed

type: Journal Article

metadata version: 2024-08-02

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Ziqiang Hu, Hao Chu, Yunzhou Zhang, Dexing Shan, You Shen:
Self-supervised assisted multi-task learning network for one-shot defect segmentation with fake defect generation. Pattern Recognit. Lett. 184: 89-96 (2024)

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