"EM-based likelihood inference for one-shot device test data under ..."

Narayanaswamy Balakrishnan, Elena Castilla (2022)

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DOI: 10.1002/QRE.3014

access: closed

type: Journal Article

metadata version: 2022-04-01

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Narayanaswamy Balakrishnan, Elena Castilla:
EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan. Qual. Reliab. Eng. Int. 38(2): 780-799 (2022)

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