"Reliability modeling of dependent competing failure processes based on ..."

Hao Lyu et al. (2023)

> Home

Details and statistics

DOI: 10.1002/QRE.3339

access: closed

type: Journal Article

metadata version: 2024-01-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/qre/LyuMQYJL23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/qre/LyuMQYJL23
Hao Lyu, Li Ma, Hongchen Qu, Zaiyou Yang, Yuliang Jiang, Bing Lu:
Reliability modeling of dependent competing failure processes based on time-dependent threshold level δ and degradation rate changes. Qual. Reliab. Eng. Int. 39(6): 2295-2310 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.