"Reliability estimation for one-shot devices under cyclic accelerated ..."

Xiaojun Zhu et al. (2021)

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DOI: 10.1016/J.RESS.2021.107595

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type: Journal Article

metadata version: 2023-07-04

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Xiaojun Zhu, Kai Liu, Mu He, N. Balakrishnan:
Reliability estimation for one-shot devices under cyclic accelerated life-testing. Reliab. Eng. Syst. Saf. 212: 107595 (2021)

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