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"An entropy-based indicator system for measuring the potential of patents ..."
Yi Zhang et al. (2017)
- Yi Zhang, Yue Qian, Ying Huang, Ying Guo, Guangquan Zhang, Jie Lu:
An entropy-based indicator system for measuring the potential of patents in technological innovation: rejecting moderation. Scientometrics 111(3): 1925-1946 (2017)
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