"Test pattern generation for crosstalk faults considering the gate delay."

Noriyoshi Itazaki, Kozo Kinoshita, Hisao Naitoh (1995)

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DOI: 10.1002/SCJ.4690260703

access: closed

type: Journal Article

metadata version: 2023-09-13

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Noriyoshi Itazaki, Kozo Kinoshita, Hisao Naitoh:
Test pattern generation for crosstalk faults considering the gate delay. Syst. Comput. Jpn. 26(7): 24-33 (1995)

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