Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Analysis of Fault Detection Probability of CMOS Combinational Circuits and ..."

Kazuhiko Iwasaki (1990)

> Home

Details and statistics

DOI: 10.1002/SCJ.4690210503

access: closed

type: Journal Article

metadata version: 2023-09-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/scjapan/Iwasaki90
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/scjapan/Iwasaki90
Kazuhiko Iwasaki:
Analysis of Fault Detection Probability of CMOS Combinational Circuits and Its Application to Signature Testing. Syst. Comput. Jpn. 21(5): 29-38 (1990)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.